SEM and TEM cross-section samples can be produced using the PELCO ® Tripod Polisher™ 590. To create a TEM sample the original sample is attached to the face of a unique SEM stud, which is then ...
Although this was a Transmission Electron Microscope (TEM) rather than an SEM ... where dimensions are measured in billionths of a meter, SEM emerges as a central investigative tool, illuminating ...
New system, same great performance: Remove hydrocarbons on TEM and SEM samples that may impact analysis. Minimize surface damage and maintain the integrity of silicon Play Minimize surface damage ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback