The group of lenses contained in the column have one main goal: de-magnify the electron beam so that by the time it hits the specimen, the "spot size" (the diameter of the electron beam at the ...

The FE-SEM is equipped with two detectors. Both are of the Everhart-Thorley type used for electron imaging. One, called the lower detector, is positioned horizontally near the specimen. The lower ...

The Triglav™ SEM column features TESCAN’s proprietary triple objective TriLens™. This immersion-type ultra-highresolution lens is ideal for imaging beam sensitive materials at low landing voltages.

TESCAN MAGNA is a powerful UHR imaging tool for the ultimate surface characterization of nanomaterials. TESCAN MAGNA features the Triglav™ SEM column with immersion TriLens™ optics that offers a ...

The following properties make the BRR microscope a worldwide unique system: The AFM component of the BRR is equipped with a classical laser deflection detection, which has been adopted to allow a very ...