Scanning electron microscopy (SEM) allows visualisation of very fine details on the sample surface using a focused beam of electrons. The most common SEM mode is detection of secondary electrons, ie.

Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples. Get analytical ...

Cryoelectron microscopy is a method for imaging frozen-hydrated specimens at cryogenic temperatures by electron microscopy. Specimens remain in their native state without the need for dyes or ...

The course provides an introduction into using electron microscopic technology (EM), and includes both Transmission electron microscopy (TEM) and Scanning electron microscopy (SEM). The course will ...