Question: Secondary ion mass spectrometry (SIMS) is one of the most sensitive surface analytical techniques. (i) What is secondary ion? How is it generated and analyzed? (ii) Briefly explain the advantages and disadvantages of SIMS analysis. (iii) What is …

Question: Explain the difference between a soft and hard ion source. Give an example of a hard and soft ion source. Explain the operation of a secondary ion mass spectrometry ion source. Is it soft or hard?. Support your explanation with a schematic drawing?

Question: Secondary ion mass spectrometry (SIMS) has a number of parameters that influence the number of detected secondary ions. Name at least 4 out of 5 parameters that influence the number of detected secondary ions in a SIMS experiment.

1. The method of secondary ion mass spectroscopy is? 2. The main limitation of the method of secondary ion mass spectroscopy to the study of solids is? 3. The need for ultar-high vacuum for a method of secondary ion mass spectrometry due to? 4. To study the method of secondary ion mass spetroscopy sufficient vacuum is at what Torr/Pa?

(10 points) You conduct dynamic secondary ion mass spectrometry (SIMS) on samples of your new material to explore the material composition at different depths, with the following results. Based on a positive control sample, you have determined that with your current dynamic SIMS settings, the material is removed at a rate of 20 nm / sec .

Question: Week 15 - Introduction to Mass Spectrometry MS Experiment Mass spectrometry (MS) is an instrument that measures the mass of charged particles. In this instrument, the structure is hit with a high energy electron which causes the loss of an electron from the original structure. e-2 e molecule molecule Molecular Ion The mass ...

You decide to utilize a surface modifying additive in the polymer melt to eliminate the need for surface modification after the original manufacturing process. a. (10 points) You conduct dynamic secondary ion mass spectroscopy (SIMS) on samples of your new material to explore the material composition at different depths, with the following results.

Question: In electron ionization mass spectrometry (EI-MS), a vapor-phase sample of the compound to be analyzed is bombarded with high-energy electrons. The individual molecules are ionized to form the molecular ion, M+.

The nitrogen rule of mass spectrometry requires a compound containing an odd number of nitrogens to have an oil mass molecular ion and a compound containing an even number of nitrogens to have an even-mass molecular on What is the molecular formula of the CHN-containing compound pyridine, M -79 (The order of atoms should be carbon, then hydrogen, …

Silicate + organic 10 peak 10 Intensity (counts/s) peak 2 peak 4 peaks 10 10 50 100 150 200 250 Mass (arbitrary units) Mass spectrum from a secondary ion mass spectrometer. Primary beam: 160 at 12.5 kV, positive secondary ions accelerated to 4500V into the mass spectrometer.